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Special Technical Publications (STPs)

• STP1382 Gate Dielectric Integrity: Material, Process, and Tool Qualification
• STP1340 Recombination Lifetime Measurements in Silicon
• STP1141 Laser-Induced Damage in Optical Materials: 1990
• STP990 Semiconductor Fabrication: Technology and Metrology
• STP1015 Laser Induced Damage in Optical Materials: 1985
• View Most Recent 25 STPs      View All STPs

Journal of Testing and Evaluation (JTE)

• Evaluation of A Humidity Sensor for Use in An Environment Exposed to Radiation
• Surface Roughness Measurement Using Laser Speckle Statistical Analysis
• Failure Analysis Using Microfocus X-ray Imaging
• Testing and Design of CMOS D-Latches
• Laser Evaluation of Cutting Angle and Surface Finish in Scalpel Blades
• View Most Recent 25 JTE papers      View All JTE papers