Subcommittee E42.14 on STM/AFM
Matching Standards Under the Jurisdiction of E42.14 by Status
- E2530-06 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps (Withdrawn 2015)
- E1813 Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy (Withdrawn 2016)
- E1813-96(2007) Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy (Withdrawn 2016)
- E2530 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps (Withdrawn 2015)